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ISO122JU

ISO122JU资料
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File Size : 116 KB Manufacturer:TI Description:Notes: 1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Dont Care. Z = HIGH Impedance. 2. Output level before LE HIGH-to-LOW Transition. 3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature range. 4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground. 5. Typical values are at VCC= 5.0V, TA= +25˚C ambient. 6. This parameter is speciﬁed but not tested. 7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reﬂect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, IOS tests should be performed last. 8. Tested at +25˚C.