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IR3P96

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File Size : 116 KB Manufacturer:SHARP Description:NOTES: (1) Junction Temperature = Ambient Temperature for low temperature limit and 25C guaranteed specifications. Junction Temperature = Ambient Temperature + 23C at high temperature limit guaranteed specifications. (2) TEST LEVELS: (A) 100% tested at 25C. Over temperature limits by characterization and simulation. (B) Limits set by characterization and simulation. (C) Typical value for information only. (3) Current is considered positive out of node. (4) CMIR tested as < 3dB degradation from minimum CMRR at specified limits. (5) I VH (VH bias current) is positive, and IVL (VL bias current) is negative, under these conditions. See Note 3 and Figures 1 and 7. (6) Limiter feedthrough is the ratio of the output magnitude to the sinewave added to V H (or VL) when VIN = 0. (7) VH slew rate conditions are: V IN = +0.7V, G = +6, VL = C2V, VH = step between 2V and 0V. VL slew rate conditions are similar. (8) Linearity Guardband is defined for an output sinusoid (f = 1MHz, VO = 2Vpp) centered between the limiter levels (VH and VL). It is the difference between the limiter level and the peak output voltage where SFDR decreases by 3dB (see Figure 8).