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| IDT7134LA70J资料 | |
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IDT7134LA70J PDF Download |
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File Size : 116 KB
Manufacturer:IDT Description:The IDT7134LA70J extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is im- proved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each IDT7134LA70J supports up to 3 local IEEE1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be ac- complished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be per- formed on one port while other scan chains are simulta- neously tested. |
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| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：IDT7134LA70J 厂 家：IDT 封 装： 批 号：1k 数 量：PLCC52 说 明： |
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运 费： 所在地： 新旧程度： |
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| 联系人：关女士 |
| 电 话：86-75584720945 |
| 手 机： |
| QQ：371911117 |
| MSN：gjk8477@hotmail.com,jessica848377@yahoo.com.cn |
| 传 真：86-755 25621209 |
| EMail：kingrand_tek@163.com |
| 公司地址： Huaqiang Electronic World, Futian District, Shenzhen, China |
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